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Schottky Diode Testing & Defects
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Transmission Lines and Schottky Diode $108.33 A nonlinear relation between current and voltage for schottky resonant tunneling diode is used. A general form of equation similar to VanDer Pol equation is obtained. A Resonant tunneling diode(RTD) has a negative differential resistance that means when the voltage increases the current decreases. This property is very useful for oscillators manufacture. Nonlinear transmission lines is considered to show that it canbe used in oscillators and to show that it can reshape the sinusoidal signals to othershapes by using OrCad and mathematica programming. Author: ElKhozondar, Hala J./ ElKhozondar, Rifa J./ Abo Ireban, Ibtisam Binding Type: Paperback Number of Pages: 80 Publication Date: 2011/07/12 Language: English Dimensions: 9.02 x 5.98 x 0.19 inches |
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Studies of Schottky Contacts on Indium Phosphide $129.05 Metalsemiconductor contacts are one of the most widely used rectifying contacts in semiconductor industry. Therefore, the fabrication of high quality Schottky contacts is essential to improve the performance of the device. InP is a material of particular interest for optoelectronic and highspeed electronic devices. In view of the important applications, the fabrication of Schottky contacts to InP is of vital importance. The contacts formed should have electrical and thermal stability with desired surface morphology. During the technological stages leading to the final device, InP substrates unavoidably undergo many thermal treatments involving rapid thermal annealing. This book includes the fabrication and characterization of Schottky contacts to InP formed with high temperature stable metals like ruthenium and molybdenum. The Schottky structures formed on InP are rapid thermal annealed and its effect on the electrical, structural properties and deep level defects are investigated. The results presnted in the book will be useful for those working in the field of semiconductor Schottky contact fabrication. Author: Janardhanam, Vallivedu/ Ashok Kumar, A./ R. Reddy, V. Binding Type: Paperback Number of Pages: 144 Publication Date: 2011/01/26 Language: English Dimensions: 5.98 x 9.00 x 0.34 inches |
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Software Testing Techniques : Finding the Defects That Matter $48.75 No Synopsis Available |
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits $146.2 No Synopsis Available |
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testing $120.98 testing |
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Wafer Testing $54.86 High Quality Content by WIKIPEDIA articles Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test patterns to them. The wafer testing is performed by a piece of test equipment called a wafer prober. The process of wafer testing can be referred to in several ways: Wafer Sort (WS), Wafer Final Test (WFT), Electronic Die Sort (EDS) and Circuit Probe (CP) are probably the most common. Author: Surhone, Lambert M./ Timpledon, Miriam T./ Marseken, Susan F. Binding Type: Paperback Number of Pages: 72 Publication Date: 2010/07/12 Language: English Dimensions: 6.00 x 9.00 x 0.17 inches |
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Black Box Testing Strategies for Functional Testing $114.71 Black box testing techniques are important to test the functionality of the system without knowing its inner detail which makes sure correct, consistent, complete and accurate behavior or function of a system. Black box testing strategies are used to test logical, data or behavioral dependencies, to generate test data and quality of test cases which have potential to guess more defects. Black box testing strategies play pivotal role to detect possible defects in system and can help in successful completion of system according to functionality. The studies of five companies regarding important black box testing strategies are presented in this thesis. This study explores the black box testing techniques which are present in literature and practiced in industry as well. Interview studies are conducted in companies of Pakistan providing solutions to finance industry, which is an attempt to find the usage of these techniques. The advantages and disadvantages of identified Black box testing strategies are discussed, along with it; the comparison of different techniques with respect to most defect guessing, dependencies, sophistication, effort, and cost is presented as well. Author: Saeed, Umar/ Mahmood, Ansur Binding Type: Paperback Number of Pages: 124 Publication Date: 2010/05/19 Language: English Dimensions: 5.98 x 9.01 x 0.29 inches |
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Cost-effective Software Testing (Hardcover) $170.34 This book enables software test analysts to apply lessons learned at work. Presenting several software testing strategies, including how to use suggested testing processes and how to identify and record errors, failures, and defects, this volume teaches the fundamentals of writing effective test plans and test cases, concentrating on the importance of verifying good requirement specifications. Readers will learn to estimate, analyze, plan, execute, and manage software testing, as well as generate status reports and report defects. Focusing heavily on the essentials of testing, this book gives software test analysts the tools and strategies to effectively identify and record errors, failures, and defects in software. |
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Pile Integrity Testing $135.42 Low strain pile integrity testing which utilizes one dimensional wave propagation theory makes it possible to detect major discontinuities or defects (cavities, cracks, decrease and increase in crosssection) within a pile quickly and economically. In this study, pile integrity testing data of 187 piles in two close sites located in Buyukcekmece, Istanbul are analyzed. The test method utilized in this project is the sonic echo method. The aim of this study is to detect occurrence of discontinuities along the pile axis. As the test data reflect the change in impedance, possible impedance diversity due to soil conditions must be known beforehand. In this manner, impedance difference caused by the discontinuities in the pile is distinguished and acquired. Using TNOWAVEs SITWAVE application, pile integrity testing is simulated and signal matching procedure is executed. In order to achieve reliable results using SITWAVE, sufficient soil investigation must be performed to determine the soil layers and soil parameters properly. In the signal matching process, the test signal data are matched with the reference signal data simulated by the software. Author: Ozudogru, Tolga Y. Binding Type: Paperback Number of Pages: 144 Publication Date: 2011/04/15 Language: English Dimensions: 5.98 x 9.02 x 0.34 inches |
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Schottky Problem $71.7 High Quality Content by WIKIPEDIA articles In mathematics, the Schottky problem, named after Friedrich Schottky, is a classical question of algebraic geometry, asking for a characterisation of Jacobian varieties amongst abelian varieties.If one describes the moduli space Ag in intuitive terms, as the parameters on which an abelian variety depends, then the Schottky problem asks simply what condition on the parameters implies that the abelian variety comes from a curves Jacobian. The classical case, over the complex number field, has received most of the attention, and then an abelian variety A is simply a complex torus of a particular type, arising from a lattice in Cg. In relatively concrete terms, it is being asked which lattices are the period lattices of compact Riemann surfaces. Author: Surhone, Lambert M./ Timpledon, Miriam T./ Marseken, Susan F. Binding Type: Paperback Number of Pages: 78 Publication Date: 2010/08/10 Language: English Dimensions: 6.00 x 9.02 x 0.19 inches |
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DIODE $12 When these electrical items fail there is little choice but to renew - With this genuine Suzuki par.. |
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Testing AspectOriented Programs with State Models $96.59 The new constructs in aspectoriented programming can cause hazards to quality assurance. To detect aspect defects, this book presents a statebased approach to systematic modeling and testing of aspects. We extend finite state machines with notations for specifying incremental modification aspects, integration aspects, and combination aspects. We compose aspect models with their base class models through an explicit weaving mechanism. We adapt the roundtrip path testing of objectoriented programs to the generation of test sequences from wovenstate models. An incremental testing process is exploited to determine whether failures, if revealed, have to do with aspects. We have conducted a series of experiments based on three applications. To further evaluate the faultdetection ability, we have created a significant number of mutants (or variation versions) by seeding one or more aspect variations (i.e., potential faults) and exploited multivariation mutants to investigate the effect of interaction between aspect variations. Our experiments indicate that our modelbased testing approach is highly effective in the detection of the seeded aspect faults. Author: Xu, Weifeng Binding Type: Paperback Number of Pages: 96 Publication Date: 2008/08/01 Language: English Dimensions: 9.00 x 6.00 x 0.20 inches |
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Effective Methods for Software Testing, 3rd Edition $56 Written by the founder and executive director of the Quality Assurance Institute, which sponsors the most widely accepted certification program for software testing Software testing is a weak spot for most developers, and many have no system in place to find and correct defects quickly and efficiently This comprehensive resource provides step-by-step guidelines, checklists, and templates for each testing activity, as well as a self-assessment that helps readers identify the sections of the book that respond to their individual needs Covers the latest regulatory developments affecting software testing, including Sarbanes-Oxley Section 404, and provides guidelines for agile testing and testing for security, internal controls, and data warehouses CD-ROM with all checklists and templates saves testers countless hours of developing their own test documentation |
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Crown Princess Defects $39.99 Crown Princess Defects - Giclee Print |
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Birth Defects $37.22 No Synopsis Available |
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Lec 19 | MIT 3.091 Introduction to Solid State Chemistry
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